Jovan Brankov
Illinois Institute of Technology, USA
Expertise: phase contrast X-ray, machine learning, model observer, human observer, task-based image quality, mesoscopic optical imaging, advance image reconstruction, mesh modeling
Dr. Brankov is an Associate Professor of ECE and BME Departments at the Illinois Institute of Technology. His research interests include the development of image processing and analysis methods and novel imaging techniques for medical imaging, specifically: analyzer-based phase contrast X-ray mammography (ABI); agent-dependent early photon tomography (ADEPT); medical image quality assessment based on a human-observer model (using machine learning methods); 4D and 5D SPECT tomographic image reconstruction; and advanced medical imaging reconstruction methods including models based (iterative) as well as data driven (CNN). He established the Advance X-ray Imaging Laboratory (AXIL) at IIT, which is currently developing a phase-sensitive X-ray device. Dr Brankov has authored and co-authored more than 160 journal and proceeding papers. His is currently serving as: associate editor for Transactions on Biomedical Engineering (IEEE), Medical Physics (AAPM) and Journal of Medical Imaging (SPIE); program committee member for IEEE International Symposium on Biomedical Imaging and SPIE Image Perception conferences and member of BioImaging and Signal Processing (BISP) Technical Committee of the IEEE Signal Processing Society. In the past he served as: AE for Transactions on Medical Imaging (IEEE) and reviewer on a number of NIH panels.