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Distinguished Lecturers

Almir Badnjevic
Medical Devices Inspection Laboratory VERLAB
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Nicolas Chbat
Quadrus Medical technologies
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Cindy Chestek
University of Michigan
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Michela Chiappalone
University of Genoa. Italy
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David Grayden
Melbourne School of Engineering, Australia
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Michelle Johnson
University of Pennsylvania
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Chulhong Kim
Pohang University of Science and Technology, Republic of Korea
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Hermano Igo Krebs
Massachusetts Institute of Technology
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Anselmo Frizera Neto
Universidade Federal do Espírito Santo - UFES
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Deb M. Newberry
Technology Associates
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Jean-Christophe Olivo-Marin
Institut Pasteur
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Thomas Penzel
Charite University Hospital Berlin
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Nimmi Ramanujam
Duke University, United States
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Julia Schnabel
King's College London
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Darlene Solomon
Agilent, United States
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Eric Wong
Beth Israel Deaconess Medical Center / Harvard Medical School
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Jong Chul Ye
Korea Advanced Institute of Science and Technology (KAIST), Republic of Korea
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Current Distinguished Lecturers

 
Almir Badnjevic
Medical Devices Inspection Laboratory VERLAB
 
Nicolas Chbat
Quadrus Medical Technologies
Cindy Chestek
University of Michigan, Ann Arbor
(Short Bio * Talk Topics)

 

 

 


 
Michela Chiappalone
University of Genoa, Italy
 
 
 
Michelle Johnson
University of Pennsylvania
 
 
 
 
Hermano Igo Krebs
Massachusetts Institute of Technology
 
 
 
 
Anselmo Frizera Neto
Universidade Federal do Espirito Santo
 
 
 
Deb M. Newberry
Technology Associates
Jean-Christophe Olivo-Marin
Institut Pasteur
(CV * Short Bio * Talk Topics)
 
 
 
 
Thomas Penzel
Charite University Hospital Berlin
 
 
 
 
Julia Schnabel
King’s College London
Eric Wong
Agilent, United States
Melbourne School of Engineering, Australia
 
 
 
 
 
Chulhong Kim
Pohang University of Science and Technology, Republic of Korea
 
 
 
Duke University, United States
 
 
 
 
Darlene Solomon
Agilent, United States
 
 
 
 
Jong Chul Ye
Korea Advanced Institute of Science and Technology (KAIST), Republic of Korea
Technical areas: Deep learning, machine learning, biomedical imaging (MRI, CT, Ultrasound, Optics, etc.), image reconstruction, inverse problems
 

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